The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Nov. 02, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Koichi Takahashi, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/32 (2013.01); G06V 10/44 (2022.01); G06V 40/16 (2022.01);
U.S. Cl.
CPC ...
G06F 21/32 (2013.01); G06V 10/44 (2022.01); G06V 40/172 (2022.01);
Abstract

Provided are: an extraction unit that extracts a target feature quantity that is a feature quantity of target data used to perform a recognition operation; a calculation unit that calculates an unsuitability score indicating a degree of similarity between the target feature quantity and an unsuitability feature quantity that is set on the basis of a feature quantity of each piece of a plurality of sample data that deteriorate an accuracy of the recognition operation due to having the same type of unsuitability for recognition and a determination unit that determines whether or not the target data are unsuitable for the recognition operation in accordance with the unsuitability score.


Find Patent Forward Citations

Takahashi, Koichi. (2026). Biometrics apparatus, biometrics method, and recording medium (U.S. Patent No. 12688271). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12688271

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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