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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12688071 B1

PDFFull Text
Date of Patent:
Jul. 21, 2026

Filed:

May. 11, 2022

Method and system for controlling an application feature based on system metrics

Applicant:

Aeris Communications, Inc., San Jose, CA (US);

Inventors:

Sundararaj Arunachalam, Naperville, IL (US);

Mark E. Cratsenburg, Orinda, CA (US);

Drew S. Johnson, San Jose, CA (US);

Syed Zaeem Hosain, San Jose, CA (US);

Subramanian Balakrishnan, Cupertino, CA (US);

Assignee:

Aeris Communications, Inc., Santa Clara, CA (US);

Attorneys:

Guntin & Gust, PLC

Atanu Das

Primary Examiner:

Fariba Sirjani

Int. Cl.
CPC ...
G06F 9/50 (2006.01); G06F 9/48 (2006.01); G06V 20/40 (2022.01); G10L 25/57 (2013.01); G10L 25/84 (2013.01);
U.S. Cl.
CPC ...
G06F 9/5044 (2013.01); G06F 9/4881 (2013.01); G06V 20/40 (2022.01); G10L 25/57 (2013.01); G10L 25/84 (2013.01); G06F 2209/503 (2013.01);
Abstract

Computer-implemented methods, systems, and computer program products for controlling application feature processing based on central processing unit (CPU) usage and/or feature requirement to apply the application feature are disclosed. The computer-implemented method for controlling application feature processing based on central processing unit (CPU) usage to apply the application feature includes monitoring system metrics for availability of system resources; determining availability of system resources required to perform the particular application feature; determining if the particular application feature is to be applied based on the determination of the availability of system resources; and applying the particular application feature based on results of the determination of the availability of system resources.

Find Patent Forward Citations

Arunachalam, Sundararaj. (2026). Method and system for controlling an application feature based on system metrics (U.S. Patent No. 12688071). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12688071

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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