The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2026
Filed:
May. 27, 2020
Nec Corporation, Tokyo, JP;
Akira Tsuji, Tokyo, JP;
Shigeo Suzuki, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An abnormality detection system includes a measurement unit configured to acquire at least three-dimensional data indicating a distance to a target and a shape of the target by performing measurement, a central management unit configured to receive the three-dimensional data acquired by the measurement unit from the measurement unit, and a measurement data evaluation unit configured to hold in advance reference three-dimensional data, the reference three-dimensional data being the three-dimensional data to be a reference acquired by the measurement unit in the past, evaluate whether a difference between the three-dimensional data acquired by the measurement unit and the reference three-dimensional data is greater than or equal to a threshold value, and transmit an alarm to the central management unit when a result of the evaluation indicates that the difference is greater than or equal to the threshold value.