The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2026
Filed:
Sep. 21, 2021
Applicant:
Dh Technologies Development Pte. Ltd., Singapore, SG;
Inventors:
Gordana Ivosev, Condord, CA;
Chang Liu, Richmond Hill, CA;
Assignee:
DH Technologies Development Pte. Ltd., Singapore, SG;
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/86 (2006.01); B01D 15/08 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8624 (2013.01); B01D 15/08 (2013.01); G01N 30/72 (2013.01);
Abstract
Methods and systems for a signal quality assessment for mass spectrometry are provided. The system includes a processor that utilizes a wavelet-based feature extraction for the signal quality assessment of a chromatogram signal. The signal quality assessment is used to control operational parameters such as a flowrate of a pump that moves liquid droplets toward an ionization device of a mass spectrometer.
Ivosev, Gordana. (2026). Method and system for mass spectrometry signal quality assessment (U.S. Patent No. 12687529). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12687529
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile