The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2026
Filed:
Sep. 28, 2023
China Nil Research Center for Proficiency Testing, Beijing, CN;
Liang Zhang, Beijing, CN;
Haizhou Wang, Beijing, CN;
Lingtian Tang, Beijing, CN;
Yongyan Chen, Beijing, CN;
CHINA NIL RESEARCH CENTER FOR PROFICIENCY TESTING, Beijing, CN;
Abstract
The invention relates to a method for preparing simulated samples for non-destructive testing of metal materials, which can carry out reverse batch copying of cavity-type defect samples, specifically: obtaining metal samples with natural and real cavity-type defects; using high-resolution X-ray industrial CT scans the sample to obtain relevant information about cavity defects in the sample; using 3D laser printing method to batch prepare new samples with combined defect characteristics that meet defect consistency; using high-resolution X-ray industrial CT to obtain the cavity defects prepared by printing are reviewed, inspected, and evaluated with the original cavity defects to verify that the printed samples meet the requirements of cavity defect consistency; save cavity defect information, scanning parameters, powder composition and printing process parameters. The method of the invention can accurately obtain defect information, can meet various non-destructive testing requirements, can be replaced with each other, and the examination and evaluation processes can be parallelized, thereby improving the efficiency.