The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2026
Filed:
Dec. 24, 2023
Iraj Kavosh, San Jose, CA (US);
Raya Kavosh, San Jose, CA (US);
Roxanne Kavosh, San Jose, CA (US);
Abstract
The embodiments disclose a method for in-situ processing and inspection of an object including utilizing a process laser beam source in a process for a probe light beam source for in-situ inspection of an object surface, impinging at least one process laser pulse onto a target surface region, modifying at least one of the optical, mechanical, or chemical properties of a first region of the surface, generating back-reflected scattered laser light and/or laser light reflected in a specular beam off an illuminated spot on the object surface, generating scattered light emitted in a laser-surface interaction, collecting and measuring the generated scattered light and/or laser light reflected in a specular beam off an illuminated spot, and constructing an image of the modified surface wherein the constructed image is used to adjust laser pulse intensities for predetermined modifications to other regions.