The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Aug. 31, 2022
Applicants:

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Valqua, Ltd., Tokyo, JP;

Inventors:

Hiroyuki Niino, Higashihiroshima, JP;

Yehan Qiao, Machida, JP;

Tomoaki Yoshiyama, Machida, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01);
U.S. Cl.
CPC ...
G01L 1/248 (2013.01);
Abstract

To provide an internal stress confirming method of a resin which is capable of measuring an internal stress of a translucent resin such as a fluororesin and a fluororubber and dynamically confirming stress propagation, and an apparatus measuring for the same. The internal stress confirming method for confirming an internal stress of a measurement target containing a translucent resin includes irradiating the measurement target with near-infrared light having a peak wavelength in a near-infrared band of 800 nm to 2500 nm through frosted glass, a polarizer, and a ¼ wavelength plate; acquiring a near-infrared image by imaging the measurement target through a ¼ wavelength plate and an analyzer; and confirming the internal stress of the measurement target based on the near-infrared image.


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