The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Dec. 14, 2021
Applicant:

Shanghai Percipio Technology Limited, Shanghai, CN;

Inventors:

Minjie Wang, Shanghai, CN;

Yushi Liang, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/22 (2006.01); G06T 7/521 (2017.01); G06T 7/529 (2017.01); G06T 7/55 (2017.01);
U.S. Cl.
CPC ...
G01B 11/22 (2013.01); G06T 7/521 (2017.01); G06T 7/529 (2017.01); G06T 7/55 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/20221 (2013.01);
Abstract

A depth data measuring head () comprising: a structured light projection apparatus () used for projecting, under the drive of a driving apparatus () and at different projection angles, a beam having a texture to a measured space so as to form different textures on an object to be measured; and first and second image sensors () that are respectively arranged on both sides of the structured light projection apparatus (), the first and second image sensors having a predetermined relative spatial position relationship and imaging the measured space at least twice so as to obtain at least two sets of images having different texture distributions, wherein the at least two sets of images are used for obtaining single-measurement depth data of the object to be measured. The structured light projection apparatus () that reflects, at different angles, structured light generated by a light source module (I) is used, so that rapid, economical and low-failure-rate multi-pattern projection is implemented. Furthermore, the structured light projection apparatus () matches multiple pairs of binocular sensors () sharing a light path, thereby further shortening the frame interval and improving the quality of depth fusion data. Also disclosed is a depth data computing device and measurement method.


Find Patent Forward Citations

Wang, Minjie. (2026). Depth data measuring head, computing device and measurement method (U.S. Patent No. 12687387). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12687387

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…