The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2026
Filed:
Aug. 20, 2021
Viken Detection Corporation, Burlington, MA (US);
Peter J. Rothschild, Newton, MA (US);
VIKEN DETECTION CORPORATION, Burlington, MA (US);
Abstract
A system for detecting a scanning beam of x-rays includes one or more scintillator volumes oriented along an x-ray scan axis. The scintillator volume(s) receive x-rays transmitted through a target and produce scintillation photons responsively. Two or more ribbons of wavelength-shifting fibers (WSFs) are optically coupled to the scintillator volume(s) along the axis via a spatial periodic adjacency of the ribbons to the axis. The ribbons receive scintillation photons from the scintillator volume(s) via the spatial periodic adjacency as the x-ray beam scans over the scan axis. At least one respective photodetector coupled to an end of each respective ribbon detects the scintillation photons carried by the respective ribbon produces a respective signal. A signal combiner selectively combines signals from one or more ribbons, for beam positions along the scan axis, to create a combined signal representing a scan of the target. The scan can have enhanced spatial resolution.