The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Dec. 10, 2024
Applicant:

Omnivision Technologies, Inc., Santa Clara, CA (US);

Inventors:

Cheng-Wei Chu, Taipei, TW;

Guo-Yuan MA, Taipei, TW;

Cheng-Pin Lin, Saratoga, CA (US);

Assignee:

OmniVision Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 25/47 (2023.01); H04N 1/21 (2006.01); H04N 23/45 (2023.01); H04N 23/68 (2023.01); H04N 23/81 (2023.01); H04N 101/00 (2006.01);
U.S. Cl.
CPC ...
H04N 25/47 (2023.01); H04N 1/2129 (2013.01); H04N 1/2141 (2013.01); H04N 23/45 (2023.01); H04N 23/683 (2023.01); H04N 23/81 (2023.01); H04N 2101/00 (2013.01);
Abstract

EVS event data may be stored in an event buffer as a plurality of event values, each event value corresponding to a respective event frame of the plurality of event frames. For each event frame, a processor may implement an improved EDI model to update the event-frame count, for each event frame after a first event frame, and only when a current event value is different than an immediately preceding event value: (1) updating a first integral of event data based on the current event value and all preceding event values, and (2) updating a second integral of event data based on at least the first integral of event data and the event frame count, and using at least the second integral of event data, deblurring raw image data to yield a latent deblurred image.


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