The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Nov. 28, 2022
Schott Ag, Mainz, DE;
Ralf Jedamzik, Griesheim, DE;
Antoine Carré, Mainz, DE;
Sebastian Leukel, Mainz, DE;
Volker Hagemann, Nieder-Olm, DE;
Uwe Petzold, Osthofen, DE;
Lothar Bartelmess, Klein-Winternheim, DE;
Peter Nass, Mainz, DE;
SCHOTT AG, Mainz, DE;
Abstract
An imaging system, includes: a laser light source having a wavelength from 380 nm to 490 nm; and a beam guidance element, the laser light source configured for generating an average surface power density of more than 10 W/cm, the beam guidance element including a glass which has a quality factor F(436 nm)=S(436 nm)*(Abs(436 nm)+Abs(436 nm))/k, wherein S(436 nm) is a thermality at a wavelength of 436 nm, Abs(436 nm) is an additional absorbance in comparison to Abs(436 nm) at a wavelength of 436 nm after an irradiation with a power density of 345 W/cmfor 72 hours with a laser light having a wavelength of 455 nm, Abs(436 nm) is an absorbance at a wavelength of 436 nm of a sample having a thickness of 100 mm without the irradiation, k is the thermal conductivity, and the quality factor F(436 nm) is <15 ppm/W.