The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Jan. 19, 2023
Zte Corporation, Shenzhen, CN;
Xiangyang Zhu, Shenzhen, CN;
Jinghai Yu, Shenzhen, CN;
ZTE Corporation, Shenzhen, CN;
Abstract
A delay measurement method and apparatus, a storage medium and a program product are disclosed. The delay measurement method may include: acquiring target time information carried by a first delay measurement packet, the target time information including first time information filled by an intermediate node on a transmission path and second time information filled by a destination node on the transmission path; acquiring an accumulative one-way link delay from a source node to the destination node according to the first time information and the second time information; and transmitting a second delay measurement packet including the accumulative one-way link delay to the destination node, so that the destination node acquires a one-way delay from the source node to the destination node according to the accumulative one-way link delay.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile