The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Feb. 07, 2023
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Erik Olieman, Waalre, NL;

Alphons Litjes, Zijtaart, NL;

Robert Van Veldhoven, Valkenswaard, NL;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H03M 1/06 (2006.01); H03M 1/08 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
H03M 1/124 (2013.01); H03M 1/0626 (2013.01); H03M 1/08 (2013.01);
Abstract

A system and method of analog to digital conversion including an adjustable ADC, FIR filter circuitry, and a noise setting controller. The ADC samples an analog input signal to provide digital samples at a sample rate that is Y times an output rate of output digital values. The FIR filter circuitry includes Y taps with Y corresponding coefficients and is configured to filter the digital samples from the ADC and to provide filtered digital samples at the sample rate. decimation circuitry may be included to decimate the filtered digital samples by Y to provide the output digital values. The noise setting controller provides an adjustment value to the ADC to adjust noise contribution of the digital samples provided by the ADC based on corresponding coefficients of the FIR filter circuitry. The ADC is adjusted to reduce noise contribution of digital samples that correspond with higher FIR filter coefficients.


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