The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Apr. 24, 2024
Purdue Research Foundation, West Lafayette, IN (US);
Demid V. Sychev, West Lafayette, IN (US);
Vladimir M. Shalaev, West Lafayette, IN (US);
Alexandra Boltasseva, West Lafayette, IN (US);
Peigang Chen, West Lafayette, IN (US);
Morris Menghuan Yang, West Lafayette, IN (US);
Colton B. Fruhling, Lafayette, IN (US);
Alexei Lagutchev, West Lafayette, IN (US);
Alexander V. Kildishev, West Lafayette, IN (US);
Purdue Research Foundation, West Lafayette, IN (US);
Abstract
An ultrafast system for detecting incidence of a single photon is disclosed which includes a single photon avalanche detector having an inherent bandgap, a source of probe light configured to apply an incident beam onto the single photon avalanche detector, wherein the probe light is configured to apply energy less than the bandgap, and a probe beam detector, configured to receive a reflected probe beam from the single photon avalanche detector, wherein the probe beam detector is adapted to generate a signal signifying: i) incidence of a single photon from a control beam onto the single photon avalanche detector.