The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Mar. 08, 2021
Omron Corporation, Kyoto, JP;
Takako Onishi, Kyoto, JP;
Takayuki Nishi, Kyoto, JP;
Shimpei Fujii, Kyoto, JP;
Hironori Kasahara, Kyoto, JP;
Yuji Karita, Kyoto, JP;
Hiroyuki Mori, Kyoto, JP;
OMRON Corporation, Kyoto, JP;
Abstract
A measurement system includes a first feature point data generator, a second feature point data generator, and a calculator. The first feature point data generator generates first feature point data from first image data or from first shape data. The first image data is obtained from imaging of a measurement target and includes a predetermined portion of the measurement target. The first shape data is generated based on the first image data. The second feature point data generator generates second feature point data from second image data different from the first image data or from second shape data. The calculator calculates a positional correspondence of the predetermined portion of the measurement target between the first image data and the second image data or between the first shape data and the second shape data based on the first feature point data and the second feature point data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile