The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Nov. 29, 2021
Applicants:
Carl Zeiss Meditec, Inc., Dublin, CA (US);
Carl Zeiss Meditec Ag, Jena, DE;
Inventor:
Luis De Sisternes, San Franciso, CA (US);
Assignees:
CARL ZEISS MEDITEC, INC., Dublin, CA (US);
CARL ZEISS MEDITEC AG, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/40 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/40 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30041 (2013.01); G06T 2207/30101 (2013.01); G06T 2207/30168 (2013.01);
Abstract
A system, method, and/or device for determinizing a quality measure of OCT structural data and/or OCTA functional data uses a machine learning model trained to provide a single overall quality measure, or a quality map distribution for the OCT/OCTA data based on the generation of multiple features maps extracted from one or more slab views of the OCT/OCTA data. The extracted feature maps may be different texture-type maps, and the machine model is trained to determine the quality measure based on the texture maps.