The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Aug. 23, 2022
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Hiroaki Kikuchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/44 (2022.01); G06T 3/067 (2024.01); G06T 5/50 (2006.01); G06T 7/00 (2017.01); G06T 7/13 (2017.01); G06T 17/05 (2011.01); G06V 10/24 (2022.01);
U.S. Cl.
CPC ...
G06T 3/067 (2024.01); G06T 5/50 (2013.01); G06T 7/0002 (2013.01); G06T 7/13 (2017.01); G06T 17/05 (2013.01); G06V 10/24 (2022.01); G06V 10/44 (2022.01); G06T 2207/20221 (2013.01);
Abstract

In an aspect, an image processing apparatus includes a processor and a memory in which a plurality of images obtained by capturing images of a building and a three-dimensional model of the building are stored in association with each other. The processor is configured to perform a development process to perform development of the three-dimensional model into a two-dimensional image, an extraction process to extract defect information of the building on the basis of the plurality of images, a mapping process to perform mapping of the defect information to the two-dimensional image, and an output process to output the two-dimensional image to which the mapping is performed.


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