The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Dec. 23, 2021
Applicant:

Abb Schweiz Ag, Baden, CH;

Inventors:

Kai Hencken, Lörrach, DE;

Massimo Scarpellini, Dalmine, IT;

Marco Testa, Romano di Lombardia, IT;

Assignee:

ABB Schweiz AG, Baden, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/0635 (2023.01); G06F 30/20 (2020.01); G06F 111/08 (2020.01); G06F 119/04 (2020.01);
U.S. Cl.
CPC ...
G06Q 10/0635 (2013.01); G06F 30/20 (2020.01); G06F 2111/08 (2020.01); G06F 2119/04 (2020.01);
Abstract

A method for device monitoring includes: providing a plurality of fleet measurement data for at least one device, where the plurality of fleet measurement data includes a number of fleet device data measurements 'Nfleet;' providing a plurality of device measurement data for a monitored device, where the plurality of device measurement data includes a number of monitor device data measurements “Ndata;” determining a fleet distribution “Fdist” determined as a distribution of differences between consecutive measurements of the plurality of fleet measurement data; determining a device distribution “Ddist” determined as a distribution of differences between consecutive measurements of the device measurement data; determining an effective number of data measurements “Neff;” and determining a probability of failure of the monitored device, the determining including utilising the fleet distribution “Fdist,” the device distribution “Ddist,” the number of monitor device data measurements “Ndata,” and the effective number of data measurements “Neff.”


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