The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Jan. 29, 2024
Applicant:

Mftb Holdco, Inc., Seattle, WA (US);

Inventors:

Andrew Bruce, Seattle, WA (US);

Chunyi Wang, Seattle, WA (US);

Yeng Bun, Seattle, WA (US);

Andrew Martin, Seattle, WA (US);

Assignee:

MFTB Holdco, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 17/18 (2006.01); G06F 30/20 (2020.01); G06N 5/04 (2023.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 17/18 (2013.01); G06F 30/20 (2020.01); G06N 5/04 (2013.01);
Abstract

A facility for estimating a value relating to a occurrence is described. The facility receives a first occurrence that specifies a plurality of independent variables including a distinguished independent variable designated to be monotonically linked to a dependent variable. The facility subjects the first independent variable values to a statistical model to obtain a first value of the dependent variable. The facility receives a second occurrence that specifies the plurality of independent variables, the distinguished independent variable varying from the first value in a first direction. The facility subjects the second independent variable values to the statistical model to obtain a second value of the dependent variable, guaranteed not to vary from the first value of the dependent variable in a second direction opposite the first direction.


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