The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Jul. 12, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Ali Anwar, San Jose, CA (US);

Syed Amer Zawad, Reno, NV (US);

Yi Zhou, San Jose, CA (US);

Nathalie Baracaldo Angel, San Jose, CA (US);

Kamala Micaela Noelle Varma, Minneapolis, MN (US);

Annie Abay, San Jose, CA (US);

Ebube Chuba, San Jose, CA (US);

Yuya Jeremy Ong, San Jose, CA (US);

Heiko H. Ludwig, San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01);
Abstract

One embodiment of the invention provides a method for federated learning (FL) comprising training a machine learning (ML) model collaboratively by initiating a round of FL across data parties. Each data party is allocated tokens to utilize during the training. The method further comprises maintaining, for each data party, a corresponding data usage profile indicative of an amount of data the data party consumed during the training and a corresponding participation profile indicative of an amount of data the data party provided during the training. The method further comprises selectively allocating new tokens to the data parties based on each participation profile maintained, selectively allocating additional new tokens to the data parties based on each data usage profile maintained, and reimbursing one or more tokens utilized during the training to the data parties based on one or more measurements of accuracy of the ML model.


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