The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Sep. 30, 2025
Nvariate, Inc., Austin, TX (US);
Benjamin Urick, Roseville, CA (US);
Daniel L. Keller, Waitsfield, VT (US);
Richard H. Crawford, Austin, TX (US);
nVariate, Inc., Austin, TX (US);
Abstract
Methods, computer systems, and computer-readable memory media for determining a warp function. An as-designed watertight spline model of an object is received. A point cloud and the as-designed watertight spline model are used to construct a model of the object. The point cloud is obtained from a physical or virtual (simulated) inspection and/or manufacturing process. A warp function is determined based on a difference between the as-designed watertight spline model and the constructed model. The warp function is a continuous function quantifying differences between the as-designed model and the constructed model. As-preprocessed instructions for a simulation or analysis process of the object are determined based on metadata of the as-designed watertight spline model and the warp function. The simulation or analysis process is performed on the object according to the as-preprocessed instructions to produce as-simulated data, and the as-simulated data is stored in a non-transitory computer-readable memory medium.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile