The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Apr. 30, 2024
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Ryan A. Beckett, Redmond, WA (US);

Siva Kesava Reddy Kakarla, Redmond, WA (US);

Yu Yan, Issaquah, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/56 (2013.01); G06N 5/025 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 21/565 (2013.01); G06N 5/025 (2013.01); G06N 20/00 (2019.01);
Abstract

Described are examples for detecting anomalies in files. Each of multiple files can be processed to generate corresponding flat files. Values can be extracted from multiple lines of each of the flat files into a parameter vector. Patterns can be generated from the multiple lines based on the values extracted. The parameter vector and the patterns can be provided as input to a machine learning (ML) model to obtain a set of rules for the files based on conditional probabilities. The set of rules can be applied to a set of one or more files to detect anomalies in values in the set of one or more files.


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