The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Jun. 10, 2025
Applicants:

Inventec (Pudong) Technology Corp., Shanghai, CN;

Inventec Corporation, Taipei, TW;

Inventors:

Wei-Chao Chen, Taipei, TW;

Ming-Chi Chang, Taipei, TW;

Shu-Huei Yang, Taipei, TW;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/2282 (2019.01);
Abstract

A data processing device is provided, which includes a storage device and a data quality assessment measurement calculation module. The storage device is configured to obtain change data of data tables from a data center. The data quality assessment measurement calculation module is configured to calculate an updated data quality assessment measurement value and an updated data quality characteristic data according to the change data and a data quality assessment measurement reference value and perform a notification function according to the updated data quality assessment measurement value and a data quality threshold value. The data quality assessment measurement calculation module is configured to compare the updated data quality assessment measurement value with the data quality threshold value to generate a comparison result. The data quality assessment measurement calculation module is configured to generate and send a notification signal to perform a notification function according to the comparison result.


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