The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Jun. 19, 2023
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Falk Schlaudraff, Wetzlar, DE;
Florian Hoffmann, Wetzlar, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A sample manipulation device includes a manipulation light source configured to emit manipulation light, an objective configured to focus the manipulating light onto the sample to form a manipulation light beam, a scanning unit configured to move the manipulation light beam within a field of view of the objective, a sample positioning unit configured to move the sample relative to an optical axis of the objective, and a controller configured to receive manipulation data comprising at least one manipulation path, upon determining that the manipulation path is entirely outside the predetermined area, control the manipulation light source and the scanning unit such that the sample is manipulated along the manipulation path, and upon determining that at least a part of the manipulation path is inside the predetermined area, control the sample positioning unit to move the sample such that the manipulation path is entirely outside the predetermined area.