The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
May. 27, 2022
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Olaf Schrey, Duisburg, DE;
Andre Buchner, Duisburg, DE;
Jan Haase, Duisburg, DE;
Christian Nitta, Duisburg, DE;
Moritz Essig, Duisburg, DE;
Abstract
A laser measuring apparatus for measuring distances is disclosed, including a pulse laser; a photon detection device with a group of detection units; an evaluation device; a time measuring device; and a control device, wherein the control device is configured such that a plurality of measurement cycles is performed during each of the measurement operations; that one of the laser pulses is emitted with the pulse laser at the beginning of each measurement cycle of the plurality of measurement cycles; that, by means of the time measuring device, during each measurement cycle, one of the time periods is measured for each of the coincidence signals being detected during the respective measurement cycle; that the time periods measured during several of the measurement cycles of one of the measurement operations by means of the time measuring device are used to generate the measurement value of the respective measurement operation; that an adjustment of a maximum value for an event number takes place that corresponds to the number of time periods that are used during one of the measurement cycles to generate the measurement value of the respective measurement operation, wherein several of the time periods measured previously by means of the time measuring device are used for the adjustment; and that after the adjustment of the maximum value, the coincidence time is adjusted in dependence on the maximum value and a measurement value of a background radiation determined by the control device.