The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Mar. 28, 2023
Endress+hauser Se+co. KG, Maulburg, DE;
Alexander Vogel, Kirchzarten, DE;
Alexey Malinovskiy, Maulburg, DE;
Lars Karweck, Binzen, DE;
Sascha D'angelico, Rümmingen, DE;
Volker Frey, Schopfheim, DE;
Tanja Haag, Schopfheim, DE;
Christoph Schmitt, Schopfheim, DE;
Nicolas Schönborn, Rietberg, DE;
Endress+Hauser SE+Co. KG, Maulburg, DE;
Abstract
A method for checking a first clock signal generator of a first field device in a process measuring system that includes the first field device and at least two other field devices having, in each case, a clock signal generator comprises producing an actual frequency of the first clock signal generator, transmitting the produced actual frequency and the desired frequency of the first clock signal generator to the two other field devices, ascertaining deviations of the actual frequency from the desired frequency via the clock signal generators of the two other field devices, transmitting the ascertained deviations to the first field device, comparing the ascertained deviations and/or an average value of the ascertained deviations with a predetermined tolerance range of the desired frequency of the at least first clock signal generator, and outputting state information concerning the first clock signal generator based on the comparison.