The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Jan. 26, 2021
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Ming-Chuan You, New Taipei City, TW;

Andrew Patrick Couch, Allen, TX (US);

Phillip Marcus Blitz, Garland, TX (US);

Xinkun Huang, McKinney, TX (US);

Chi-Tsung Lee, New Taipei City, TW;

Roy Deidrick Solomon, Melissa, TX (US);

Enis Tuncer, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2853 (2013.01); G01R 31/2887 (2013.01); G01R 31/2889 (2013.01);
Abstract

An integrated circuit testing assembly that includes: (i) a first slug configured to contact a first surface of a first set of pins of an integrated circuit; (ii) a second slug configured to contact a second surface of the first set of pins of the integrated circuit; (iii) a third slug configured to contact a first surface of a second set of pins of the integrated circuit; and (iv) a fourth slug configured to contact a second surface of the second set of pins of the integrated circuit.


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