The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Nov. 17, 2023
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Florian Ramian, Karlsfeld, DE;

Kay-Uwe Sander, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/26 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 29/26 (2013.01); G01R 31/2837 (2013.01);
Abstract

A measurement device () for performing measurements with respect to a device under test () is provided. Said measurement device () comprises a port () for receiving a signal from the device under test (), a signal level modification unit () for modifying the corresponding level of the signal in order to form a modified signal, the signal level modification unit () being operable in at least a first operation mode and a second operation mode being different from the first operation mode, a receiving unit () for receiving and digitizing the modified signal in order to a form a digitized modified signal, and a processing unit (). The signal level of the first operation mode is set, e.g. by an attenuator of the device, such the signal-to-noise-ratio is high but the receiving unit causes non-linearity effects, and the signal level of the second operation mode is set lower, e.g. by an attenuator of the device, such that the receiving unit causes essentially no non-linearity effects.


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