The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Aug. 27, 2024
Rockwell Collins, Inc., Cedar Rapids, IA (US);
Connor Mcbryde, Cedar Rapids, IA (US);
James West, Cedar Rapids, IA (US);
Rockwell Collins, Inc., Cedar Rapids, IA (US);
Abstract
A test system is presented for validating and calibrating an active electronically scanned array (AESA) with multiple distinct transceiver elements and associated RF channels. The test system includes a static mount for the AESA, and a test probe fixedly located relative to the static mount. The system also includes a network analyzer connected to the AESA and the test probe, and a test processor connected to the network analyzer. The network analyzer provides RF evaluations of amplitudes and phases/time delays to the test processor, which estimates far field (FF) patterns of the AESA based on these inputs and assessments of free space path losses and propagation delays between the AESA and the test probe. The test processor calculates FF figures of merit (FoMs) for the AESA as a function of frequency, beam scan, and environmentals based on the estimated FF patterns, and validates the AESA based on these FF FoMs.