The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Jun. 24, 2021
Honeywell International Inc., Charlotte, NC (US);
Matthew Wiebold, Mankato, MN (US);
Thomas Dobbins, Watertown, MN (US);
Honeywell International Inc., Charlotte, NC (US);
Abstract
In some embodiments, a system for a dual-interrogated interferometer for fluid measurements includes an interferometer that provides interfered light having interference fringes, wherein the interfered light comprises emitted light from the system interfered with received light by the system. The system also includes a high-rate sensor that detects the interfered light to create high-rate measurements. Further, the system includes a two-dimensional detector array that detects the interfered light to create two-dimensional detector array measurements. Moreover, the system includes one or more processors that calculate fluid velocity in relation to the system based on a mapping of the high-rate measurements to the two-dimensional detector array measurements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile