The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Dec. 16, 2020
Applicant:

Becton, Dickinson and Company, Franklin Lakes, NJ (US);

Inventor:

Huimiao Ren, San Diego, CA (US);

Assignee:

Becton, Dickinson and Company, Franklin Lakes, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 21/77 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54388 (2021.08); G01N 21/77 (2013.01); G01N 21/8483 (2013.01); G01N 2021/7759 (2013.01);
Abstract

Lateral flow assay devices, systems, and methods described herein detect analyte present in a sample in low quantity or at low concentration by amplifying a signal generated at a detection zone. The generated signal can exceed a detection threshold of a measurement system and increase the sensitivity of the lateral flow assay devices, systems, and methods. In one aspect, the lateral flow device includes a signal-amplification conjugate that binds to a complex bound to immobilized capture agent in the detection zone, causing a chain reaction of binding events in the detection zone that result in an amplification of the signal generated in the detection zone.


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