The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Apr. 12, 2024
Shimadzu Corporation, Kyoto, JP;
Shinji Kanazawa, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
Provided is a method for analyzing a signal waveform which is a chromatogram or spectrum, including: a model creation step for creating a trained model for locating a peak portion in an input waveform, by machine learning using a plurality of sets of reference waveforms in each of which the position of the peak portion is known; a region estimation step (S-S) for dividing an analysis-target waveform into partial waveforms, for determining whether or not each of the partial waveforms is a peak portion by using the trained model, and for estimating different kinds of regions including a peak region and a non-peak region in the analysis-target waveform, based on the determination result; and a detection step (S) for detecting an incorrect region estimation result by determining whether or not the sequence of the estimated regions along the horizontal axis of the analysis-target waveform conforms to a predetermined regulation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile