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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12680986 B1

PDFFull Text
Date of Patent:
Jul. 14, 2026

Filed:

Aug. 31, 2023

Ion chromatography analysis system

Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Takuya Yonekura, Kyoto, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto, JP;

Attorney:

Renner, Otto, Boisselle & Sklar, LLP

Primary Examiner:

Peter J Macchiarolo

Assistant Examiner:

Rodney T Frank

Int. Cl.
CPC ...
G01N 30/32 (2006.01); B01D 15/14 (2006.01); B01D 15/36 (2006.01); G01N 30/14 (2006.01); G01N 30/16 (2006.01); G01N 30/64 (2006.01); G01N 30/02 (2006.01);
U.S. Cl.
CPC ...
G01N 30/32 (2013.01); B01D 15/14 (2013.01); B01D 15/367 (2013.01); G01N 30/14 (2013.01); G01N 30/16 (2013.01); G01N 30/64 (2013.01); G01N 2030/027 (2013.01); G01N 2030/326 (2013.01);
Abstract

An ion chromatography analysis system includes a system monitoring part being configured to detect an abnormality, to determine, based on a fluctuation rate in a certain time of the predetermined state of a most recent of the monitor value, whether the fluctuation is a short-term fluctuation that occurs in a short term or a long-term fluctuation that occurs in a long term, and to identify a cause of the abnormality by using whether the fluctuation is the short-term fluctuation or the long-term fluctuation.

Find Patent Forward Citations

Yonekura, Takuya. (2026). Ion chromatography analysis system (U.S. Patent No. 12680986). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12680986

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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