The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Apr. 22, 2021
Applicant:

The Regents of the University of California, Oakland, CA (US);

Inventors:

Tamir Gonen, Los Angeles, CA (US);

Michael Martynowycz, Los Angeles, CA (US);

Johan Hattne, Los Angeles, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20058 (2018.01); G01N 23/2055 (2018.01); G01N 33/68 (2006.01);
U.S. Cl.
CPC ...
G01N 23/20058 (2013.01); G01N 23/2055 (2013.01); G01N 33/6803 (2013.01); G01N 2458/00 (2013.01);
Abstract

Methods of collecting diffraction patterns from a microcrystal having an ordered array of a molecule are disclosed, which include using an exposure rate of at most 0.02 electrons per square angstrom per second on the microcrystal and using a direct electron detector to record electron diffraction patterns. Also disclosed are methods of determining a structural model for a molecule, identifying a material present in a trace amount within a sample, identifying a polymorph, and identifying the stereochemistry of a molecule.


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Gonen, Tamir. (2026). Methods for collecting electron diffraction patterns (U.S. Patent No. 12680969). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12680969

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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