The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Jun. 20, 2024
Applicant:

Ckd Corporation, Aichi, JP;

Inventors:

Yukihiro Taguchi, Aichi, JP;

Shozo Oda, Aichi, JP;

Shiori Imaizumi, Aichi, JP;

Assignee:

CKD Corporation, Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/958 (2006.01); G01N 21/952 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01N 21/958 (2013.01); G01N 21/952 (2013.01); G06T 7/0002 (2013.01); G01N 2201/02 (2013.01); G01N 2201/08 (2013.01);
Abstract

An inspection device includes: an illumination device that irradiates the inspection object with light; a rotation unit that rotates the inspection object; a fiber optical plate that holds optical fibers in parallel and has a light incident surface and a light emission surface at which outlets of the optical fibers are disposed; an imaging unit that includes sensor elements arranged in a row and respectively corresponding to the outlets, and takes an image of the inspection object; a control device that determines whether a quality of the inspection object is good or poor based on the image; and an oblique ray attenuation body that is disposed between the light emission surface and the imaging unit, and includes attenuation function elements arrayed in parallel and each having a straight cylindrical shape that surrounds an optical path between each of the outlets and each of the sensor elements.


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