The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Dec. 10, 2021
Hitachi High-tech Corporation, Tokyo, JP;
Hitachi High-Tech Corporation, Tokyo, JP;
Abstract
This far-infrared analyzing device comprises: a holding mechanism configured to be capable of holding specimen in moist air; a detector for detecting light obtained by emitting a far-infrared light beam onto the specimen; and a signal processing unit for computing an absorption spectrum of the specimen from a signal from the detector. The signal processing unit acquires: a first spectrum detected by the detector when the far-infrared light beam is emitted along measurement optical path while the wavelength of the far-infrared light beam is changed, without the specimen being on the measurement optical path; and a second spectrum detected by the detector when the far-infrared light beam is emitted along the measurement optical path while the wavelength of the far-infrared light beam is changed, with the specimen on the measurement optical path. Then, a difference between the spectrum signals is calculated at frequency intervals determined in accordance with an absorption peak due to water vapor, and the frequency of the absorption peak due to water vapor is selected in accordance with a comparison between the difference and a threshold. Data removal is performed for the spectrum signals on the basis of the selected frequency.