The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Oct. 26, 2023
Zhejiang University, Hangzhou City, CN;
Jin Wang, Hangzhou, CN;
Yongfeng Wang, Hangzhou, CN;
Zhejiang University, Hangzhou City, CN;
Abstract
The present disclosure provides an in-situ testing system of metal materials under high temperature and complex loads. The testing system includes a fatigue testing unit, a high-temperature loading unit, a signal detecting unit and a base. The fatigue testing unit is configured for pre-tightening a sample and then performing a fatigue testing on the sample. The high-temperature loading unit is configured for heating the sample to a high temperature. The signal detecting unit includes a pressure sensor and a displacement sensor. The pressure sensor is configured for monitoring the tensile force on the sample. The displacement sensor is configured for monitoring the displacement of the sample after being stretched during the pre-tightening of the sample. The base is configured for bearing the fatigue testing unit, the high-temperature loading unit and the signal detecting unit, and can be positioned on a scanning electron microscope stage or an open microscopic device.