The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Dec. 24, 2020
Applicant:
Lg Energy Solution, Ltd., Seoul, KR;
Inventors:
Assignee:
LG ENERGY SOLUTION, LTD., Seoul, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/08 (2006.01); G01B 11/16 (2006.01); G01N 3/06 (2006.01);
U.S. Cl.
CPC ...
G01N 3/08 (2013.01); G01B 11/16 (2013.01); G01N 3/06 (2013.01); G01N 2203/0017 (2013.01); G01N 2203/0075 (2013.01); G01N 2203/0268 (2013.01); G01N 2203/0282 (2013.01); G01N 2203/0641 (2013.01); G01N 2203/0652 (2013.01); G01N 2203/0682 (2013.01);
Abstract
The present invention relates to a method for evaluating physical properties of a thin film specimen and a thin film specimen for a tensile test of the present invention, and according to the present invention, reliability of measured physical properties can be increased, and an abnormal damage of a thin film specimen can be suppressed by analyzing the strain rate of a speckle pattern formed on the thin film specimen by using a digital image correlation analysis scheme during a tensile test of the thin film specimen.