The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Mar. 01, 2022
Applicant:

Hahn-schickard-gesellschaft Für Angewandte Forschung E. V., Villingen-Schwenningen, DE;

Inventors:

Bernd Folkmer, Constance, DE;

Thorsten Hehn, Reute, DE;

Manuel Koehler, Buchenbach, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/04 (2006.01); G01L 1/18 (2006.01); G01L 5/162 (2020.01);
U.S. Cl.
CPC ...
G01L 1/04 (2013.01); G01L 1/18 (2013.01); G01L 5/162 (2013.01);
Abstract

An apparatus for measuring deformations, stresses, forces and/or torques of an object includes a spring body and a sensor chip, which includes one or more sensor elements for measuring a deformation, stress, force and/or a torque as well as an electronic circuit on a substrate. The spring body includes a base plate on the front side of which a force conductor, preferably in the form of a pin, is installed, the sensor chip being positioned on the rear side of the base plate below the force conductor. Also disclosed a system including the apparatus and a data processing unit, wherein the data processing unit is configured for reading out measured data detected by the sensor chip and preferably detects the forces and/or torques acting on the force conductor based thereon.


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