The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Jul. 22, 2022
Applicant:

President and Fellows of Harvard College, Cambridge, MA (US);

Inventors:

Noah A. Rubin, Cambridge, MA (US);

Paul Chevalier, Cambridge, MA (US);

Federico Capasso, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/04 (2006.01); G02B 1/00 (2006.01); G02B 5/18 (2006.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
G01J 4/04 (2013.01); G02B 1/002 (2013.01); G02B 5/1842 (2013.01); G02B 26/0808 (2013.01);
Abstract

An attachment for an intensity-only sensor in an imaging device includes a polarization-sensitive diffraction grating. The polarization-sensitive diffraction grating is configured to receive incident light from a scene, and to modify the incident light to simultaneously produce a plurality of non-overlapping images of the scene. each of a different diffraction order, on the intensity-only sensor to facilitate full-Stokes imaging polarimetry. The attachment includes a first adjustment mechanism configured to control at least one of: vignetting of the plurality of non-overlapping images on the intensity-only sensor, or an object distance of the imaging device.


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