The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Dec. 16, 2021
Applicants:

Endress+hauser Se+co. KG, Maulburg, DE;

Universität Basel, Basel, CH;

Inventors:

Raphael Kuhnen, Schliengen, DE;

Mohammad Sadegh Ebrahimi, Lörrach, DE;

Johannes Kölbl, Basel, CH;

Assignee:

Endress+Hauser SE+Co. KG, Maulburg, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01F 23/292 (2006.01);
U.S. Cl.
CPC ...
G01F 23/2922 (2013.01);
Abstract

A sensor device for determining and/or monitoring a process variable of a medium in a container includes: a crystal body having at least one defect; and a magnetic field device for generating a magnetic field, the magnetic field device arranged such that a magnetic field can be generated in the region of the crystal body and in the region of the medium located within the container, so that a change of the magnetic field in the region of the crystal body is amplified, wherein the crystal body and the magnetic field device are arranged from the outside on a wall of the container. A method for determining and/or monitoring a process variable of a medium in a container using the sensor device is also disclosed.


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