The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Oct. 27, 2021
Tews Elektronik Gmbh & Co. KG, Hamburg, DE;
Hendrik Richter, Hamburg, DE;
TEWS ELEKTRONIK GMBH & CO. KG, Hamburg, DE;
Abstract
A method for calibrating a measuring apparatus includes measuring a set of measured values for products including one or more measured variables. A first set of calibration parameters is determined having one or more weights for one or more of the products. The one or more products is grouped within a first product family. Some of the products in the first product family comprise an equal weight. At least a second set of calibration parameters is determined where one or more sets of additional weights are determined within the first product family. Products with equal weights are grouped into a sub product family within the first product family. Weights for the products outside of the first product family are determined and products with equal weights are grouped into another product family until all weights are determined.