The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Oct. 26, 2023
Applicant:

The Procter & Gamble Company, Cincinnati, OH (US);

Inventors:

Todd Douglas Lenser, Liberty Township, OH (US);

Randall Allen Myers, Fairfield, OH (US);

Russell Andrew Hayden, New Richmond, OH (US);

Keith Richard Willhaus, Cincinnati, OH (US);

Assignee:

The Procter & Gamble Company, Cincinnati, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B29C 67/00 (2017.01); B29L 31/48 (2006.01); B29C 59/04 (2006.01); B29L 31/00 (2006.01);
U.S. Cl.
CPC ...
B29C 67/0048 (2013.01); B29C 59/046 (2013.01); B29L 2031/4878 (2013.01); B29L 2031/729 (2013.01);
Abstract

A method is presented for altering a portion of a substrate. The method includes providing a first device including an outer surface and a second device including a source of vibration energy. The method also includes forming a nip between the source of vibration energy and the outer surface. The method also includes conveying the substrate through the nip and intermittently altering the portion of the substrate in the nip to create a pattern of altered areas forming a shape. The altered areas have a pattern balance that includes one or more of: an average area of the substrate altered in the nip is within a threshold range across the portion of the substrate; and a simple area of integral areas within the altered areas is within a threshold range across the portion of the substrate.


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