The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Sep. 13, 2022
Applicant:

Sintokogio, Ltd., Nagoya, JP;

Inventors:

Yusuke Yamada, Nagoya, JP;

Isaku Kenjo, Nagoya, JP;

Takehiro Okamoto, Nagoya, JP;

Takeyuki Sugiura, Nagoya, JP;

Satoshi Kobayashi, Nagoya, JP;

Assignee:

SINTOKOGIO, LTD., Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24C 7/00 (2006.01); B24C 1/10 (2006.01); B24C 3/14 (2006.01);
U.S. Cl.
CPC ...
B24C 7/0092 (2013.01); B24C 1/10 (2013.01); B24C 3/14 (2013.01);
Abstract

A processor () carries out, after a device is activated and before a blasting medium projected to a projection target object (), a first inspection process (T) for determining, in a state in which no blasting medium () is supplied to an impeller () while each motor of the impeller is rotating, whether a current value supplied to the each motor of the impeller is not more than a first threshold (θ), and a second inspection process (T') for determining, in a state in which the impeller is projecting the blasting medium, whether the current value supplied to the each motor of the impeller is not less than a second threshold (θ), and displays, on a display (), at least one of (1) respective determination results of the first inspection process and the second inspection process and (2) a determination result obtained by generalizing the determination results (1).


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