The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

May. 02, 2023
Applicant:

Materialise NV, Leuven, BE;

Inventors:

Pieter Slagmolen, Leuven, BE;

Christophe Van Dijck, Leuven, BE;

Koen Engelborghs, Leuven, BE;

Andy Enefer, Leuven, BE;

Assignee:

Materialise N.V., Leuven, BE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/58 (2024.01); A61B 6/00 (2024.01); G06T 7/60 (2017.01); G06T 7/73 (2017.01); G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
A61B 6/582 (2013.01); A61B 6/5247 (2013.01); A61B 6/5294 (2013.01); G06T 7/60 (2013.01); G06T 7/75 (2017.01); G06T 7/80 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30008 (2013.01); G06T 2207/30052 (2013.01);
Abstract

Certain embodiments provide a system for calibrating an X-ray image. The system may receive an X-ray image of an anatomical part of a patient. The system may further receive a 3-D surface scan of a surface of the patient where the anatomical part is located. The system may derive a measurement correction to apply to measurements of the X-ray image based on the 3-D surface scan. The measurement correction may account for: an orientation of the patient with respect to the X-ray detector plate, a first distance between the patient and the detector plate, or a second distance between the patient and an X-ray source used to generate the X-ray image. The system may further determine a corrected measurement of the anatomical part based on the measurement correction and a measurement taken from the X-ray image.


Find Patent Forward Citations

Loading…