The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Jul. 24, 2023
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Masanori Matsumoto, Nasushiobara, JP;

Saki Hashimoto, Nasushiobara, JP;

Keisuke Sugawara, Otawara, JP;

Shingo Abe, Nasushiobara, JP;

Akio Tetsuka, Shioya, JP;

Yusuke Kanno, Sendai, JP;

Yoshiyuki Sato, Nasushiobara, JP;

Hisayuki Uehara, Otawara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/46 (2024.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 6/545 (2013.01); A61B 6/469 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10116 (2013.01);
Abstract

According to one embodiment, an X-ray diagnostic apparatus includes processing circuitry. The processing circuitry sets a plurality of ROIs in a first X-ray image. The processing circuitry calculates a statistical value for each ROI based on a plurality of values of pixels included in each ROI, thereby obtaining a plurality of statistical values. The processing circuitry acquires a threshold value for each statistical value. The processing circuitry determines a set of X-ray conditions relating to capturing of a second X-ray image subsequent to the first X-ray image based on the statistical value and the threshold value relating to each ROI.


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