The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Jun. 22, 2024
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Akihiro Ishida, Nasushiobara, JP;

Takayuki Yamazaki, Nasushiobara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/42 (2024.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4291 (2013.01); A61B 6/4241 (2013.01); A61B 6/488 (2013.01); A61B 6/5205 (2013.01);
Abstract

An X-ray image diagnostic system of an embodiment includes processing circuitry. The processing circuitry is configured to acquire an image obtained by imaging a plurality of detection elements that output signals in response to incident X-rays, and a plurality of scattered radiation removal plates arranged at least in a channel direction on the side of a first surface of the plurality of detection elements on which the X-rays are incident in a direction substantially normal to the first surface, and generate data regarding an irradiated area of each of the plurality of detection elements on the basis of the image.


Find Patent Forward Citations

Ishida, Akihiro. (2026). X-ray image diagnostic system, x-ray image diagnostic method, and storage medium (U.S. Patent No. 12678112). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12678112

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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