The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Dec. 31, 2021
Sunrise Technologies Co., Ltd., Beijing, CN;
Kexin Xu, Beijing, CN;
Tongshuai Han, Beijing, CN;
Picheng Zhao, Beijing, CN;
Mingfei Yao, Beijing, CN;
SUNRISE TECHNOLOGIES CO., LTD., Beijing, CN;
Abstract
A method of measuring a tissue element, a device of measuring a tissue element, and a wearable apparatus are provided. The method includes: irradiating a measurement region with incident light having at least one predetermined wavelength (S), where each beam of the incident light is incident on an incident position to form at least one beam of exit light exited from at least one exit position on the measurement region; and arranging an anti-jitter portion at a position corresponding to the measurement region, so that an average optical path of exit light received by a measurement probe associated with the anti-jitter portion is maintained within a predetermined optical path range during a skin jitter process at the measurement region (S).