The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Feb. 17, 2022
Applicant:

Topcon Corporation, Tokyo, JP;

Inventors:

Hiroaki Okada, Tokyo, JP;

Yoko Tatara, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/103 (2006.01); A61B 3/107 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/1005 (2013.01); A61B 3/103 (2013.01); A61B 3/107 (2013.01);
Abstract

An ophthalmologic apparatus includes a first left eye measurement optical system for measurement of dimensional information in a front-back direction of a left eye, a second left eye measurement optical system for measurement of a corneal shape of the left eye, a third left eye measurement optical system for measurement of a refractive property of the left eye, a first right eye measurement optical system for measurement of dimensional information in a front-back direction of a right eye, a second right eye measurement optical system for measurement of a corneal shape of the right eye, a third right eye measurement optical system for measurement of a refractive property of the right eye, and a control unit to control the first, second and third left eye measurement optical systems and the first, second and third right eye measurement optical systems.


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