The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Mar. 01, 2020
Applicant:

Sri International, Menlo Park, CA (US);

Inventors:

Jenn-Kwei Tyan, Princeton, NJ (US);

Michael Raymond Piacentino, Robbinsville, NJ (US);

Assignee:

SRI International, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); A61B 1/05 (2006.01); A61B 1/06 (2006.01);
U.S. Cl.
CPC ...
A61B 1/000094 (2022.02); A61B 1/00006 (2013.01); A61B 1/000095 (2022.02); A61B 1/00096 (2013.01); A61B 1/05 (2013.01); A61B 1/0646 (2013.01);
Abstract

An example apparatus includes a light source, first and second polarizers, an image sensor, a filter, and control circuitry. The light source outputs a light beam, and the first polarizer passes first polarized light from the output light beam and toward a sample. The image sensor collects light reflected from the sample responsive to the passed first polarized light. The second polarizer passes second polarized light from the reflected light and toward the image sensor. The filter selectively passes the reflected light in a visible light range and near infrared range (NIR) light range toward the image sensor. The control circuitry causes the first and second polarizers to adjust to different polarization angles, and collects the image data of the sample from the reflected light.


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